Material-selective planarization of oxide layers : A novel technologyDETZEL, T; HANESCH, P.Materials science forum. 1998, pp 227-230, issn 0255-5476, isbn 0-87849-815-XConference Paper

Electronic structure of a catalyst poison : Br/Pt(110)MENZEL, A; SWAMY, K; BEER, R et al.Surface science. 2000, Vol 454-56, pp 88-93, issn 0039-6028Conference Paper

Interdiffusion in amorphous Si/SiC multilayersKOLODZEY, J; HANESCH, P; FISCHER, T et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1992, Vol 11, Num 1-4, pp 43-46Conference Paper

Limitations of interface sharpness in a-Si:H/a-SiC:H multilayersSCHWARZ, R; FISCHER, T; HANESCH, P et al.Applied surface science. 1991, Vol 50, Num 1-4, pp 456-461, issn 0169-4332, 6 p.Conference Paper